Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits.

MLA

Adell, Philippe C., et al. “Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits.” IEEE Transactions on Nuclear Science, vol. 56, no. 6, Dec. 2009, pp. 3326–33. EBSCOhost, https://doi.org/10.1109/TNS.2009.2033797.

APA

Adell, P. C., Pease, R. L., Barnaby, H. J., Rax, B., Chen, X. J., & McClure, S. S. (2009). Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits. IEEE Transactions on Nuclear Science, 56(6), 3326–3333. https://doi.org/10.1109/TNS.2009.2033797

Chicago

Adell, Philippe C., Ronald L. Pease, Hugh J. Barnaby, Bernard Rax, Xiao J. Chen, and Steven S. McClure. 2009. “Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits.” IEEE Transactions on Nuclear Science 56 (6): 3326–33. doi:10.1109/TNS.2009.2033797.