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Three-Dimensional CMOS SOI Integrated Circuit Using High-Temperature Metal-Induced Lateral Crystallization.
- Source :
-
IEEE Transactions on Electron Devices . Jul2001, Vol. 48 Issue 7, p1394. 6p. 1 Black and White Photograph, 2 Diagrams, 2 Charts, 7 Graphs. - Publication Year :
- 2001
-
Abstract
- Proposes a three-dimensional (3-D) complementary metal oxide semiconductor (CMOS) integrated circuit based on the conventional CMOS silicon-on-insulator technology. Discussion on the 3-D thin film transistor CMOS technology and design issues; Description on the fabrication process; Device characteristics; Inverter characteristics and circuit performance.
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 48
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 4763166
- Full Text :
- https://doi.org/10.1109/16.930657