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Three-Dimensional CMOS SOI Integrated Circuit Using High-Temperature Metal-Induced Lateral Crystallization.

Authors :
Chan, Victor W. C.
Chan, Philip C. H.
Chan, Mansun
Source :
IEEE Transactions on Electron Devices. Jul2001, Vol. 48 Issue 7, p1394. 6p. 1 Black and White Photograph, 2 Diagrams, 2 Charts, 7 Graphs.
Publication Year :
2001

Abstract

Proposes a three-dimensional (3-D) complementary metal oxide semiconductor (CMOS) integrated circuit based on the conventional CMOS silicon-on-insulator technology. Discussion on the 3-D thin film transistor CMOS technology and design issues; Description on the fabrication process; Device characteristics; Inverter characteristics and circuit performance.

Details

Language :
English
ISSN :
00189383
Volume :
48
Issue :
7
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
4763166
Full Text :
https://doi.org/10.1109/16.930657