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Silicon nanowires synthesis on a submicronic terminal: Structural and electrical characterization.

Authors :
Abed, Hichem
Sahaf, Houda
Reguer, Alan
Rochdi, Nabil
Tonneau, Didier
Bedu, Frederic
Dallaporta, Hervé
Jamgotchian, Haik
Source :
Journal of Applied Physics. Jan2010, Vol. 107 Issue 2, p024310-024315. 5p. 1 Black and White Photograph, 2 Charts, 3 Graphs.
Publication Year :
2010

Abstract

In this work, we investigate localized silicon nanowires synthesis in a room temperature-controlled silane filled chamber using submicronic resistors as heating devices. These resistors consist in circuit-connected W wires obtained, on silicon oxide substrates, by focused ion beam induced deposition (FIBID) technology. Our study demonstrates that the morphology of the synthesized nanowires is temperature and time dependent revealing a thermal gradient but also both vapor-liquid-solid and vapor-solid growth effects. Typical silicon nanowires dimensions are a length of 1–2 μm and diameters of 30–40 nm. Structural characterization is performed by high resolution transmission electron microscopy using high energy electron transparent self-supported silicon nitride membranes. Electrical characteristics of FIBID- and self-connected nanowires are obtained. In both cases, they exhibit rectifying behavior. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
107
Issue :
2
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
47807267
Full Text :
https://doi.org/10.1063/1.3284940