Cite
Projecting Lifetime of Deep Submicron MOSFETs.
MLA
Erhong Li, et al. “Projecting Lifetime of Deep Submicron MOSFETs.” IEEE Transactions on Electron Devices, vol. 48, no. 4, Apr. 2001, p. 671. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=4794192&authtype=sso&custid=ns315887.
APA
Erhong Li, Rosenbaum, E., Jiang Tao, & Peng Fang. (2001). Projecting Lifetime of Deep Submicron MOSFETs. IEEE Transactions on Electron Devices, 48(4), 671.
Chicago
Erhong Li, Elyse Rosenbaum, Jiang Tao, and Peng Fang. 2001. “Projecting Lifetime of Deep Submicron MOSFETs.” IEEE Transactions on Electron Devices 48 (4): 671. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=asx&AN=4794192&authtype=sso&custid=ns315887.