Cite
Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing images.
MLA
Sim, K. S., et al. “Reducing Scanning Electron Microscope Charging by Using Exponential Contrast Stretching Technique on Post-Processing Images.” Journal of Microscopy, vol. 238, no. 1, Apr. 2010, pp. 44–56. EBSCOhost, https://doi.org/10.1111/j.1365-2818.2009.03328.x.
APA
Sim, K. S., Tan, Y. Y., Lai, M. A., Tso, C. P., & Lim, W. K. (2010). Reducing scanning electron microscope charging by using exponential contrast stretching technique on post-processing images. Journal of Microscopy, 238(1), 44–56. https://doi.org/10.1111/j.1365-2818.2009.03328.x
Chicago
Sim, K. S., Y. Y. Tan, M. A. Lai, C. P. Tso, and W. K. Lim. 2010. “Reducing Scanning Electron Microscope Charging by Using Exponential Contrast Stretching Technique on Post-Processing Images.” Journal of Microscopy 238 (1): 44–56. doi:10.1111/j.1365-2818.2009.03328.x.