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PRODUCT NEWS.

Source :
Solid State Technology. Feb2010, Vol. 53 Issue 2, p22-22. 1p.
Publication Year :
2010

Abstract

The article evaluates several products including Iris wafer and die inspection system from SemiProbe LLC, GreenTape 7k7 glass-ceramic dielectric tape from DuPont Microcircuit Materials and 450PM series of probing stations from Micromanipulator Co.

Details

Language :
English
ISSN :
0038111X
Volume :
53
Issue :
2
Database :
Academic Search Index
Journal :
Solid State Technology
Publication Type :
Academic Journal
Accession number :
48734996