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Anomalous magnetic responsiveness of giant magnetoresistive heads under specific electromagnetic interference frequencies using quasistatic tester.

Authors :
Kruesubthaworn, Anan
Pratoomthip, Aphaiphak
Siritaratiwat, Apirat
Ungvichian, Vichate
Source :
Journal of Applied Physics. Apr2008, Vol. 103 Issue 7, p07F538. 3p.
Publication Year :
2008

Abstract

The giant magnetoresistive (GMR) heads have been used in the computer industry for decade. Recently, the anomalous performance caused by cell phones or external electromagnetic interference (EMI) is reported [V. Kraz and A. Wallash, J. Electrost. 54, 39 (2002)]; [Kruesubthaworn et al., J. Magn. Magn. Mater. 316, e142 (2007)] This prompts an experimental study of an anomalous magnetic disturbance to the heads under ascending and descending frequency variations. The rf generator with predetermined output is set for 30–1000 MHz swept frequency in both directions, with the antenna being horizontal and vertical orientations. Five quasistatic tester (QST) parameters; magnetoresistive (MR) resistance, MR amplitude, asymmetry, Barkhausen noise, and hysteresis are used as markers in the EMI sensitivity study of head gimbal assembly. It is found that the worst change of MR amplitude is 10.2% (marginally over the norm), which occurs at 910 MHz during ascending swept frequency and horizontal polarization. The largest variation of hysteresis parameter is 21.8% (1.5 times over the norm) during 940 MHz descending swept frequency and horizontal polarization. The remaining parameters have small effects, less than 6.5%. During the EMI exposure, QST transfer curves show significant departure from the frequencies of 500–580, 700–850, and 900–1000 MHz. However, the trace separation is returned back to the preexposure condition. The scanning electron microscope evaluation of the GMR head after the exposure appears to be normal. Therefore, these parameter disturbances are not adequate to cause visible damage, but since some parameters are over the manufacturing accepted QST values, it may cause a latently failed head. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
103
Issue :
7
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
48992420
Full Text :
https://doi.org/10.1063/1.2838738