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Microwave performance enhancement in Double and Single Gate HEMT with channel thickness variation

Authors :
Gupta, Ritesh
Rathi, Servin
Gupta, Mridula
Gupta, R.S.
Source :
Superlattices & Microstructures. Jun2010, Vol. 47 Issue 6, p779-794. 16p.
Publication Year :
2010

Abstract

Abstract: In Single Gate HEMT (SGHEMT) shortening of gate length below 100 nm leads to reduction in Transconductance , which reduces the unloaded voltage gain of the device, thereby reducing the maximum frequency of oscillation . The main reason for this reduction in with in the Single Gate HEMT (SGHEMT) is its inability to maintain the desired channel aspect ratio (). At such a miniaturization level, not only depends on the channel depth but also on the channel thickness of the device . Moreover, the variation of may switch the device characteristics from quantum regime to classical regime . The Double Gate HEMT (DGHEMT)  has emerged as a solution for further reduction in and provides enhancements over SGHEMT by virtue of its double gate and also for same due to double heterojunctions, which virtually increases the value of . In the present work, extensive simulation work has been carried out using ATLAS device simulator  in order to study the effect of and on DGHEMT and SGHEMT. An analytical model has also been proposed for SGHEMT and DGHEMT to incorporate the effect of variation of and . [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
07496036
Volume :
47
Issue :
6
Database :
Academic Search Index
Journal :
Superlattices & Microstructures
Publication Type :
Academic Journal
Accession number :
51106778
Full Text :
https://doi.org/10.1016/j.spmi.2010.03.003