Back to Search Start Over

Chemical etchant dependence of surface structure and morphology on GaN(0001) substrates

Authors :
Hattori, Azusa N.
Kawamura, Fumio
Yoshimura, Masashi
Kitaoka, Yasuo
Mori, Yusuke
Hattori, Ken
Daimon, Hiroshi
Endo, Katsuyoshi
Source :
Surface Science. Aug2010, Vol. 604 Issue 15/16, p1247-1253. 7p.
Publication Year :
2010

Abstract

Abstract: We studied the procedure of cleaning GaN(0001) substrate surfaces by wet etching and subsequent annealing in ultrahigh vacuum for two different types of freestanding GaN wafers: hydride vapor phase epitaxy (HVPE) crystal and Na flux liquid phase epitaxy (LPE) crystal wafers. A flat surface containing GaN(0001)2×2 reconstruction was successfully achieved on both HVPE and LPE surfaces by etching in HF and subsequent annealing at ∼550°C but was not achieved by etching in HCl, NaOH, and HNO3. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00396028
Volume :
604
Issue :
15/16
Database :
Academic Search Index
Journal :
Surface Science
Publication Type :
Academic Journal
Accession number :
51435149
Full Text :
https://doi.org/10.1016/j.susc.2010.04.004