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Study of Ferroelectric Bi3.25La0.75Ti3O12 Thin Films Deposited by Sol-Gel Method.

Authors :
Khachane, M.
Chevallier, V.
Gavarri, J. R.
Muller, Ch.
Turquat, C.
Elaatmani, M.
Zegzouti, A.
Luk'yanchuk, I. A.
Source :
Ferroelectrics. 2010, Vol. 397 Issue 1, p112-121. 10p. 3 Black and White Photographs, 1 Diagram, 2 Charts, 4 Graphs.
Publication Year :
2010

Abstract

Powders and thin films of ferroelectric Bi3.25La0.75Ti3O12 (BLT) have been prepared from a sol-gel precursor heated at various temperatures, up to 600°C. The BLT precursor and the BLT powders have been characterized by thermal analyses, X-ray diffraction (XRD), scanning and transmission electron microscopy (SEM and TEM). Then, the precursor has been used to deposit thin films of ferroelectric BLT on specific silicon substrates, using a specific spin coating process. The thin films have been characterized by XRD, SEM and ellipsometry. Electrical polarization analyses have been finally performed on these films, and performing remnant polarization has been obtained. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00150193
Volume :
397
Issue :
1
Database :
Academic Search Index
Journal :
Ferroelectrics
Publication Type :
Academic Journal
Accession number :
51743826
Full Text :
https://doi.org/10.1080/00150193.2010.484748