Cite
Imaging dislocations in gallium nitride across broad areas using atomic force microscopy.
MLA
Bennett, S. E., et al. “Imaging Dislocations in Gallium Nitride across Broad Areas Using Atomic Force Microscopy.” Review of Scientific Instruments, vol. 81, no. 6, June 2010, p. 063701. EBSCOhost, https://doi.org/10.1063/1.3430539.
APA
Bennett, S. E., Holec, D., Kappers, M. J., Humphreys, C. J., & Oliver, R. A. (2010). Imaging dislocations in gallium nitride across broad areas using atomic force microscopy. Review of Scientific Instruments, 81(6), 063701. https://doi.org/10.1063/1.3430539
Chicago
Bennett, S. E., D. Holec, M. J. Kappers, C. J. Humphreys, and R. A. Oliver. 2010. “Imaging Dislocations in Gallium Nitride across Broad Areas Using Atomic Force Microscopy.” Review of Scientific Instruments 81 (6): 063701. doi:10.1063/1.3430539.