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Study on Generalized Analysis Model for Fringe Pattern Profilometry.
- Source :
-
IEEE Transactions on Instrumentation & Measurement . Jan2008, Vol. 57 Issue 1, p160-167. 8p. 1 Diagram, 7 Graphs. - Publication Year :
- 2008
-
Abstract
- This paper presents a generalized analysis model for fringe pattern profilometry. We mathematically derived a new analysis model that gives a more general expression of the relationship between projected and deformed fringe patterns. Meanwhile, based on the proposed generalized model, a new algorithm is presented to retrieve 3-D surfaces from nonlinearly distorted fringes. Without any prior knowledge about the projection system, we still can obtain very accurate measurement results by using a generalized analysis model and a proposed algorithm. Computer simulation and experimental results show that the generalized model and the proposed algorithm can significantly improve the 3-D reconstruction precision, especially when the projected fringe pattern is nonlinearly distorted. [ABSTRACT FROM PUBLISHER]
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 57
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- 52037812
- Full Text :
- https://doi.org/10.1109/TIM.2007.909417