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High force sensitivity in Q-controlled phase-modulation atomic force microscopy.
- Source :
-
Applied Physics Letters . 7/5/2010, Vol. 97 Issue 1, p011906. 3p. 1 Diagram, 2 Graphs. - Publication Year :
- 2010
-
Abstract
- We investigate the dependence of effective Q-factor on force sensitivity in Q-controlled phase-modulation atomic force microscopy. With Q-control, the phase noise density spectrum shows a characteristic dependence on modulation frequency (fm). The phase noise density spectrum is nearly constant in the low-fm region, whereas it decreases inverse-proportionally to fm in the high-fm region. Such a decrease enhances the force sensitivity. We demonstrate that force sensitivity can be markedly increased with Q-control to exceed the limit of force sensitivity without Q-control. [ABSTRACT FROM AUTHOR]
- Subjects :
- *FORCE & energy
*PHASE modulation
*ATOMIC force microscopy
*NOISE
*DENSITY
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 97
- Issue :
- 1
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 52060159
- Full Text :
- https://doi.org/10.1063/1.3457431