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Nanostructure and strain analysis of CeO2/YSZ strained superlattice
- Source :
-
Materials Science & Engineering: B . Oct2010, Vol. 173 Issue 1-3, p220-228. 9p. - Publication Year :
- 2010
-
Abstract
- Abstract: In this study, the nanostructure and the strain fields in the superlattice [CeO2/YSZ]5 fabricated on the SiO2/Si(001) substrate were investigated macroscopically and nanoscopically using X-ray diffraction (XRD) and high-resolution transmission electron microscopy (HRTEM) with geometric phase analysis (GPA) and related methods. The XRD analyses elucidated that the out-of-plane lattice parameter of CeO2 and YSZ layers is relaxed. However, the in-plane lattice parameter is almost identical. Results of HRTEM and related analyses revealed that CeO2 and YSZ layers form a superlattice structure. Results show that the superlattice has some defect structure, such as misorientation, varied thickness of CeO2 and YSZ layers, varied artificial periodicity, and interface roughness. However, the out-of-plane lattice parameter has periodicity corresponding to the superlattice structure. The in-plane lattice parameter is also equal to the local deviation. Therefore, the strain effect in the superlattice persists to some degree. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 09215107
- Volume :
- 173
- Issue :
- 1-3
- Database :
- Academic Search Index
- Journal :
- Materials Science & Engineering: B
- Publication Type :
- Academic Journal
- Accession number :
- 52821475
- Full Text :
- https://doi.org/10.1016/j.mseb.2010.02.013