Cite
Quantitative measurement of local elasticity of SiOx film by atomic force acoustic microscopy.
MLA
Cun, He, et al. “Quantitative Measurement of Local Elasticity of SiOx Film by Atomic Force Acoustic Microscopy.” Chinese Physics B, vol. 19, no. 8, Aug. 2010, p. 084302. EBSCOhost, https://doi.org/10.1088/1674-1056/19/8/084302.
APA
Cun, H., Gai, Z., and, M., & Bin, W. (2010). Quantitative measurement of local elasticity of SiOx film by atomic force acoustic microscopy. Chinese Physics B, 19(8), 084302. https://doi.org/10.1088/1674-1056/19/8/084302
Chicago
Cun, He, Zhang Gai, Mei and, and Wu Bin. 2010. “Quantitative Measurement of Local Elasticity of SiOx Film by Atomic Force Acoustic Microscopy.” Chinese Physics B 19 (8): 084302. doi:10.1088/1674-1056/19/8/084302.