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Interface layer thickness effect on the photocurrent of Pt sandwiched polycrystalline ferroelectric Pb(Zr,Ti)O3 films.
- Source :
-
Applied Physics Letters . 9/6/2010, Vol. 97 Issue 10, p102104. 3p. 1 Color Photograph, 1 Diagram, 3 Graphs. - Publication Year :
- 2010
-
Abstract
- Based on the analysis of the photocurrent behavior of Pt sandwiched Pb(Zr0.2Ti0.8)O3 (PZT) films, the experimental evidence of top Pt/PZT interface layer thickness effect on the photocurrent is reported. It was well established before that the photocurrent of metal/ferroelectric film is attributed to the height of Schottky contact barrier. However, our results suggest that the photocurrent of Pt/PZT interface contact is determined not only by the barrier height but also by the interface layer thickness, namely, by the built-in electrical field at the interface layer. The mechanism behind such photocurrent phenomenon is proposed. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 97
- Issue :
- 10
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 53507776
- Full Text :
- https://doi.org/10.1063/1.3488829