Cite
A New Multipulse Technique for Probing Electron Trap Energy Distribution in High- \kappa Materials for Flash Memory Application.
MLA
Zheng, Xue Feng, et al. “A New Multipulse Technique for Probing Electron Trap Energy Distribution in High- \kappa Materials for Flash Memory Application.” IEEE Transactions on Electron Devices, vol. 57, no. 10, Oct. 2010, pp. 2484–92. EBSCOhost, https://doi.org/10.1109/TED.2010.2062520.
APA
Zheng, X. F., Zhang, W. D., Govoreanu, B., Zhang, J. F., & van Houdt, J. (2010). A New Multipulse Technique for Probing Electron Trap Energy Distribution in High- \kappa Materials for Flash Memory Application. IEEE Transactions on Electron Devices, 57(10), 2484–2492. https://doi.org/10.1109/TED.2010.2062520
Chicago
Zheng, Xue Feng, Wei Dong Zhang, Bogdan Govoreanu, Jian Fu Zhang, and Jan van Houdt. 2010. “A New Multipulse Technique for Probing Electron Trap Energy Distribution in High- \kappa Materials for Flash Memory Application.” IEEE Transactions on Electron Devices 57 (10): 2484–92. doi:10.1109/TED.2010.2062520.