Cite
Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam
MLA
Barabash, R. I., et al. “Mapping Strain Gradients in the FIB-Structured InGaN/GaN Multilayered Films with 3D X-Ray Microbeam.” Materials Science & Engineering: A, vol. 528, no. 1, Nov. 2010, pp. 52–57. EBSCOhost, https://doi.org/10.1016/j.msea.2010.04.045.
APA
Barabash, R. I., Gao, Y. F., Ice, G. E., Barabash, O. M., Chung, J.-S., Liu, W., Kröger, R., Lohmeyer, H., Sebald, K., Gutowski, J., Böttcher, T., & Hommel, D. (2010). Mapping strain gradients in the FIB-structured InGaN/GaN multilayered films with 3D X-ray microbeam. Materials Science & Engineering: A, 528(1), 52–57. https://doi.org/10.1016/j.msea.2010.04.045
Chicago
Barabash, R.I., Y.F. Gao, G.E. Ice, O.M. Barabash, Jin-Seok Chung, W. Liu, R. Kröger, et al. 2010. “Mapping Strain Gradients in the FIB-Structured InGaN/GaN Multilayered Films with 3D X-Ray Microbeam.” Materials Science & Engineering: A 528 (1): 52–57. doi:10.1016/j.msea.2010.04.045.