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Shear-force atomic force microscope by using the second resonance regime of tuning fork probe.
- Source :
-
Applied Physics Letters . 11/8/2010, Vol. 97 Issue 19, p193108. 3p. - Publication Year :
- 2010
-
Abstract
- An imaging scheme of shear-force atomic force microscope is proposed by exploiting the second resonance regime of the tuning fork probe. Theoretical analysis and experimental results demonstrate that the imaging scheme can deliver better sensitivity and higher resolution of topographic imaging. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 97
- Issue :
- 19
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 55171816
- Full Text :
- https://doi.org/10.1063/1.3518057