Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen.

Authors :: Pease, Ronald L.
Adell, Philippe C.
Rax, Bernard
McClure, Steven
Barnaby, Hugh J.
Kruckmeyer, Kirby
Triggs, B.
Source :: IEEE Transactions on Nuclear Science. 12/1/2010 Part 1, Vol. 57 Issue 6, p3419-3425. 7p.
Publication Year :: 2010
Abstract: An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened “ELDRS-free” part types have been tested using this same approach to see if the test is overly conservative. [ABSTRACT FROM AUTHOR]