Cite
Charge Collection and SEU in SiGe HBT Current Mode Logic Operating at Cryogenic Temperatures.
MLA
Xu, Ziyan, et al. “Charge Collection and SEU in SiGe HBT Current Mode Logic Operating at Cryogenic Temperatures.” IEEE Transactions on Nuclear Science, vol. 57, no. 6, Dec. 2010, pp. 3206–11. EBSCOhost, https://doi.org/10.1109/TNS.2010.2085050.
APA
Xu, Z., Niu, G., Luo, L., Cressler, J. D., Alles, M. L., Reed, R., Mantooth, H. A., Holmes, J., & Marshall, P. W. (2010). Charge Collection and SEU in SiGe HBT Current Mode Logic Operating at Cryogenic Temperatures. IEEE Transactions on Nuclear Science, 57(6), 3206–3211. https://doi.org/10.1109/TNS.2010.2085050
Chicago
Xu, Ziyan, Guofu Niu, Lan Luo, John D. Cressler, Michael L. Alles, Robert Reed, H. Alan Mantooth, James Holmes, and Paul W. Marshall. 2010. “Charge Collection and SEU in SiGe HBT Current Mode Logic Operating at Cryogenic Temperatures.” IEEE Transactions on Nuclear Science 57 (6): 3206–11. doi:10.1109/TNS.2010.2085050.