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Critique Components For Test Applications.

Authors :
Browne, Jack
Source :
Microwaves & RF. Jan2011, Vol. 50 Issue 1, p58-60. 2p. 1 Color Photograph.
Publication Year :
2011

Abstract

The article focuses on the test-equipment components which can be considered for measuring various it's in a particular test system. It states that the components for test should offer instrument-grade performance like the attenuators that must provide excellent impedance match relative to the voltage standing wave ratio (VSWR). It says that various companies within the component manufacturing industry supply different components which maintain performance tolerance and manufacturing.

Details

Language :
English
ISSN :
07452993
Volume :
50
Issue :
1
Database :
Academic Search Index
Journal :
Microwaves & RF
Publication Type :
Periodical
Accession number :
59353556