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Optimal Dual-Tone Frequency Selection for ADC Sine-Wave Tests.
- Source :
-
IEEE Transactions on Instrumentation & Measurement . 04/15/2011, Vol. 60 Issue 5, p1533-1545. 13p. - Publication Year :
- 2011
-
Abstract
- An automated frequency selection algorithm for dual-tone analog-to-digital converter sine-wave test that guarantees optimal test coverage in the phase-plane is presented. The proposed method relaxes some constraints of the existing phase-space design methodology. This enables wider application of the phase-space method in test frequency selection. The proposed algorithm also extends the previous works by generating a good frequency pair while taking into account various hardware constraints in the production environment. Quality measures for phase-plane coverage is proposed and evaluated, followed by the theoretical analysis and description of the phase-plane uniformity. Extensive computer simulation is carried out to validate the proposed technique. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189456
- Volume :
- 60
- Issue :
- 5
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Instrumentation & Measurement
- Publication Type :
- Academic Journal
- Accession number :
- 59822889
- Full Text :
- https://doi.org/10.1109/TIM.2010.2102393