Cite
Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature.
MLA
Qiu, W., et al. “Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature.” IEEE Transactions on Applied Superconductivity, vol. 21, no. 3, June 2011, pp. 135–38. EBSCOhost, https://doi.org/10.1109/TASC.2010.2081653.
APA
Qiu, W., Terai, H., & Wang, Z. (2011). Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature. IEEE Transactions on Applied Superconductivity, 21(3), 135–138. https://doi.org/10.1109/TASC.2010.2081653
Chicago
Qiu, W., H. Terai, and Z. Wang. 2011. “Measurement of Epitaxial NbN/AlN/NbN Tunnel Junctions With a Low Critical Current Density at Low Temperature.” IEEE Transactions on Applied Superconductivity 21 (3): 135–38. doi:10.1109/TASC.2010.2081653.