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Angle-resolved characteristics of silicon photovoltaics with passivated conical-frustum nanostructures
- Source :
-
Solar Energy Materials & Solar Cells . Sep2011, Vol. 95 Issue 9, p2610-2615. 6p. - Publication Year :
- 2011
-
Abstract
- Abstract: Passivation plays a critical role in silicon photovoltaics, yet how a passivation layer affects the optical characteristics of nano-patterned surfaces has rarely been discussed. In this paper, we demonstrate conical-frustum nanostructures fabricated on silicon solar cells using polystyrene colloidal lithography with various silicon–nitride (SiN x ) passivation thicknesses. The omnidirectional and broadband antireflective characteristics were determined by utilizing angle-resolved reflectance spectroscopy. The conical-frustum arrays with a height of 550nm and a SiN x thickness of 80nm effectively suppressed the Fresnel reflection in the wavelength range from 400 to 1000nm, up to an incidence angle of 60°. As a result, the power conversion efficiency achieved was 13.39%, which showed a 9.13% enhancement compared to that of a conventional KOH-textured silicon cell. The external quantum efficiency measurements confirmed that the photocurrent was mostly contributed by the increased optical absorption in the near-infrared. The angular cell efficiencies were estimated and showed improvements over large angles of incidence. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 09270248
- Volume :
- 95
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Solar Energy Materials & Solar Cells
- Publication Type :
- Academic Journal
- Accession number :
- 61487639
- Full Text :
- https://doi.org/10.1016/j.solmat.2011.05.010