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- Source :
-
Insight: Non-Destructive Testing & Condition Monitoring . Jul2011, Vol. 53 Issue 7, p405-407. 3p. 3 Color Photographs, 3 Black and White Photographs. - Publication Year :
- 2011
-
Abstract
- The article offers brief information on several nondestructive testing products including GS2020 'EMAT Adaptor' from Sonemat, the Raptor portable ultrasonic imaging flaw detector from NDT Systems Inc., and new SU9000 field emission (FE) scanning electron microscope (SEM) from Hitachi High-Technologies Corp.
Details
- Language :
- English
- ISSN :
- 13542575
- Volume :
- 53
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- Insight: Non-Destructive Testing & Condition Monitoring
- Publication Type :
- Academic Journal
- Accession number :
- 62300970
- Full Text :
- https://doi.org/10.1784/insi.2011.53.7.405