Back to Search Start Over

Precise Subpixel Disparity Measurement From Very Narrow Baseline Stereo.

Authors :
Morgan, Gareth Llewellyn Keith
Liu, Jian Guo
Yan, Hongshi
Source :
IEEE Transactions on Geoscience & Remote Sensing. Sep2010, Vol. 48 Issue 9, p3424-3433. 10p.
Publication Year :
2010

Abstract

To obtain depth-from-stereo imagery, it is traditionally required that the baseline separation between images (or the base-to-height ratio) be very large in order to ensure the largest image disparity range for effective measurement. Typically, a B/H ratio in the range of 0.6–1 is preferred. As a consequence, most existing stereo-matching algorithms are designed to measure disparities reliably with only integer-pixel precision. However, wide baselines may increase the possibility of occlusion occurring between highly contrasting relief, imposing a serious problem to digital elevation model (DEM) generation in urban and highly dissected mountainous areas. A narrow-baseline stereo configuration can alleviate the problem significantly but requires very precise measurements of disparity at subpixel levels. In this paper, we demonstrate a stereo-matching algorithm, based upon the robust phase correlation method, that is capable of directly measuring disparities up to 1/50th pixel accuracy and precision. The algorithm enables complete and dense surface shape information to be retrieved from images with unconventionally low B/H ratios (e.g., less than 0.01), potentially allowing DEM generation from images that would otherwise not be deemed suitable for the purpose. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
01962892
Volume :
48
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Geoscience & Remote Sensing
Publication Type :
Academic Journal
Accession number :
62331598
Full Text :
https://doi.org/10.1109/TGRS.2010.2046672