Investigation on the effect of Zr doping in ZnO thin films by spray pyrolysis

Abstract: Zirconium doped zinc oxide thin films with enhanced optical transparency were prepared on Corning 1737 glass substrates at the substrate temperature of 400°C by spray pyrolysis method for various doping concentrations of zirconium (IV) chloride in the spray solution. The X-ray diffraction studies reveal that the films exhibit hexagonal crystal structure with polycrystalline grains oriented along (002) direction. The crystalline quality of the films is found to be deteriorating with the increase of doping concentration and acquires amorphous state for higher concentration of 8at.% in precursor solution. The average transmittance for 5at.% (solution) zirconium doped ZnO film is significantly increased to ∼92% in the visible region of 500–800nm. The room temperature photoluminescence (PL) spectra of films show a band edge between 3.41 and 3.2eV and strong blue emission at 2.8eV irrespective of doping concentration and however intensity increases consistently with doping levels. The vacuum annealing at 400°C reduced the resistivity of the films significantly due to the coalescence of grains and the lowest resistivity of 2×10−3 Ωcm is observed for 3at.% (solution) Zr doped ZnO films which envisages that it is a good candidate for stable TCO material. [Copyright &y& Elsevier]