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Erratum: ‘‘Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities’’ [Appl. Phys. Lett. 66, 335 (1995)].
- Source :
-
Applied Physics Letters . 10/21/1996, Vol. 69 Issue 17, p2608. 1p. 1 Graph. - Publication Year :
- 1996
-
Abstract
- Provides a corrected reprint to the article 'Thermal dependence of the refractive index of GaAs and AlAs measured using semiconductor multilayer optical cavities,' published in a 1995 issue of the journal 'Applied Physics Letters.'
- Subjects :
- THERMAL properties of semiconductors
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 69
- Issue :
- 17
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 6289990
- Full Text :
- https://doi.org/10.1063/1.118159