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A Two-Phase Test Sample Sparse Representation Method for Use With Face Recognition.

Authors :
Xu, Yong
Zhang, David
Yang, Jian
Yang, Jing-Yu
Source :
IEEE Transactions on Circuits & Systems for Video Technology. Sep2011, Vol. 21 Issue 9, p1255-1262. 8p.
Publication Year :
2011

Abstract

In this paper, we propose a two-phase test sample representation method for face recognition. The first phase of the proposed method seeks to represent the test sample as a linear combination of all the training samples and exploits the representation ability of each training sample to determine M “nearest neighbors” for the test sample. The second phase represents the test sample as a linear combination of the determined M nearest neighbors and uses the representation result to perform classification. We propose this method with the following assumption: the test sample and its some neighbors are probably from the same class. Thus, we use the first phase to detect the training samples that are far from the test sample and assume that these samples have no effects on the ultimate classification decision. This is helpful to accurately classify the test sample. We will also show the probability explanation of the proposed method. A number of face recognition experiments show that our method performs very well. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10518215
Volume :
21
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Transactions on Circuits & Systems for Video Technology
Publication Type :
Academic Journal
Accession number :
65218978
Full Text :
https://doi.org/10.1109/TCSVT.2011.2138790