Cite
Failure mechanism of GTO devices and optimization for minimum current crowding during turn-off.
MLA
Liang, Y. C., and T. K. Kee. “Failure Mechanism of GTO Devices and Optimization for Minimum Current Crowding during Turn-Off.” International Journal of Electronics, vol. 77, no. 6, Dec. 1994, p. 869. EBSCOhost, https://doi.org/10.1080/00207219408926107.
APA
Liang, Y. C., & Kee, T. K. (1994). Failure mechanism of GTO devices and optimization for minimum current crowding during turn-off. International Journal of Electronics, 77(6), 869. https://doi.org/10.1080/00207219408926107
Chicago
Liang, Y.C., and T.K. Kee. 1994. “Failure Mechanism of GTO Devices and Optimization for Minimum Current Crowding during Turn-Off.” International Journal of Electronics 77 (6): 869. doi:10.1080/00207219408926107.