Cite
Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM.
MLA
Ielmini, Daniele, et al. “Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM.” IEEE Transactions on Electron Devices, vol. 58, no. 10, Oct. 2011, pp. 3246–53. EBSCOhost, https://doi.org/10.1109/TED.2011.2161088.
APA
Ielmini, D., Nardi, F., & Cagli, C. (2011). Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM. IEEE Transactions on Electron Devices, 58(10), 3246–3253. https://doi.org/10.1109/TED.2011.2161088
Chicago
Ielmini, Daniele, Federico Nardi, and Carlo Cagli. 2011. “Universal Reset Characteristics of Unipolar and Bipolar Metal-Oxide RRAM.” IEEE Transactions on Electron Devices 58 (10): 3246–53. doi:10.1109/TED.2011.2161088.