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Influence of local atomic configuration in AlGdN phosphor thin films on deep ultra-violet luminescence intensity.

Authors :
Kitayama, Shinya
Yoshitomi, Hiroaki
Iwahashi, Shinya
Nakamura, Junya
Kita, Takashi
Chigi, Yoshitaka
Nishimoto, Tetsuro
Tanaka, Hiroyuki
Kobayashi, Mikihiro
Ishihara, Tsuguo
Izumi, Hirokazu
Source :
Journal of Applied Physics. Nov2011, Vol. 110 Issue 9, p093108. 4p. 7 Graphs.
Publication Year :
2011

Abstract

We investigated the narrowband ultraviolet emission properties of Al0.94Gd0.06N phosphor thin films pumped by an electron beam. An extremely narrow luminescence line, which was less than 1 nm from the intra-orbital f-f transition in Gd3+ ions, was confirmed at 318 nm. The corresponding emission efficiency was improved by decreasing the growth temperature. The extended X-ray absorption fine structure analysis of the local atomic structure revealed that a low-temperature growth led to the formation of a uniform atomic configuration around Gd, which was found to play a key role in improving the luminescence intensity of the films. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
110
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
67225629
Full Text :
https://doi.org/10.1063/1.3658845