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Electrostatic force microscopy using a quartz tuning fork.
- Source :
-
Applied Physics Letters . 6/10/2002, Vol. 80 Issue 23, p4324. 3p. 2 Black and White Photographs, 1 Graph. - Publication Year :
- 2002
-
Abstract
- We demonstrate an electrostatic force microscopy based on a quartz tuning fork with 50 nm spatial resolution and 1 pN force sensitivity. We use a tuning fork with a spring constant of 1300 N/m and a Q factor of 3000. A sharpened nickel tip is attached to a prong of the tuning fork as well as electrically connected to the electrode of the prong. By applying a dc bias to the tip, ferroelectric domain patterns are recorded and read out on piezoelectric thin film. [ABSTRACT FROM AUTHOR]
- Subjects :
- *QUARTZ
*TUNING forks
Subjects
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 80
- Issue :
- 23
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 6754941
- Full Text :
- https://doi.org/10.1063/1.1485312