Back to Search Start Over

Analysis and Optimization of Thermal-Driven Global Interconnects in Nanometer Design.

Authors :
Jiang, Lele
Cheng, Yuhua
Mao, Junfa
Source :
IEEE Transactions on Components, Packaging & Manufacturing Technology. Oct2011, Vol. 1 Issue 10, p1564-1572. 9p.
Publication Year :
2011

Abstract

Global interconnects play an increasingly important role in nanometer-scale integrated technologies. The optimization of global wire size (width and/or spacing) has been well studied. However, many optimization methodologies do not consider thermal effects. As technology scales, decreasing interconnect pitch and the introduction of low-k dielectrics have made self-heating of global interconnects an important issue. In this paper, we present a temperature-aware methodology for systematically optimizing the size of global interconnects with optimal repeater for maximizing the circuit performance. We develop techniques to calculate the full-chip temperature as a function of global interconnect width and spacing and analytically analyze the impacts of wire size on the substrate and self-heating temperature. We then reinvestigate the temperature -and size-dependent interconnect delay, bandwidth, and power consumption, and define a product of the delay per unit length, power dissipation per unit length, and reciprocal bandwidth per unit chip edge as an appropriate figure of merit for optimum wire size for various International Technology Roadmap for Semiconductors technology nodes. [ABSTRACT FROM PUBLISHER]

Details

Language :
English
ISSN :
21563950
Volume :
1
Issue :
10
Database :
Academic Search Index
Journal :
IEEE Transactions on Components, Packaging & Manufacturing Technology
Publication Type :
Academic Journal
Accession number :
69665236
Full Text :
https://doi.org/10.1109/TCPMT.2011.2165212