Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides.

MLA

Esqueda, Ivan S., et al. “Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides.” IEEE Transactions on Nuclear Science, vol. 58, no. 6, Dec. 2011, pp. 2945–52. EBSCOhost, https://doi.org/10.1109/TNS.2011.2168569.

APA

Esqueda, I. S., Barnaby, H. J., Adell, P. C., Rax, B. G., Hjalmarson, H. P., McLain, M. L., & Pease, R. L. (2011). Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides. IEEE Transactions on Nuclear Science, 58(6), 2945–2952. https://doi.org/10.1109/TNS.2011.2168569

Chicago

Esqueda, Ivan S., Hugh J. Barnaby, Philippe C. Adell, Bernard G. Rax, Harold P. Hjalmarson, Michael L. McLain, and Ronald L. Pease. 2011. “Modeling Low Dose Rate Effects in Shallow Trench Isolation Oxides.” IEEE Transactions on Nuclear Science 58 (6): 2945–52. doi:10.1109/TNS.2011.2168569.