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An Empirical Model to Determine the Grain Size of Metal-Induced Lateral Crystallized Film.

Authors :
Chan, Victor W. C.
Chan, Philip C. H.
Source :
IEEE Transactions on Electron Devices. Aug2002, Vol. 49 Issue 8, p1399. 6p. 2 Black and White Photographs, 2 Diagrams, 1 Chart, 3 Graphs.
Publication Year :
2002

Abstract

Provides information on a study which fabricated thin-film transistors using the nickel-seeded metal-induced lateral crystallization (MILC) in which an amorphous silicon is crystallized to form a large grain polysilicon film. Description of the MILC process; Mobility models of solid phase crystallization and MILC devices; Experimental results and discussion.

Details

Language :
English
ISSN :
00189383
Volume :
49
Issue :
8
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
7107655
Full Text :
https://doi.org/10.1109/TED.2002.801269