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An Empirical Model to Determine the Grain Size of Metal-Induced Lateral Crystallized Film.
- Source :
-
IEEE Transactions on Electron Devices . Aug2002, Vol. 49 Issue 8, p1399. 6p. 2 Black and White Photographs, 2 Diagrams, 1 Chart, 3 Graphs. - Publication Year :
- 2002
-
Abstract
- Provides information on a study which fabricated thin-film transistors using the nickel-seeded metal-induced lateral crystallization (MILC) in which an amorphous silicon is crystallized to form a large grain polysilicon film. Description of the MILC process; Mobility models of solid phase crystallization and MILC devices; Experimental results and discussion.
- Subjects :
- *THIN film transistors
*CRYSTALLIZATION
Subjects
Details
- Language :
- English
- ISSN :
- 00189383
- Volume :
- 49
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electron Devices
- Publication Type :
- Academic Journal
- Accession number :
- 7107655
- Full Text :
- https://doi.org/10.1109/TED.2002.801269