Cite
Multisine With Optimal Phase-Plane Uniformity for ADC Testing.
MLA
Ong, Meng Sang, et al. “Multisine With Optimal Phase-Plane Uniformity for ADC Testing.” IEEE Transactions on Instrumentation & Measurement, vol. 61, no. 3, Mar. 2012, pp. 566–78. EBSCOhost, https://doi.org/10.1109/TIM.2011.2169614.
APA
Ong, M. S., Kuang, Y. C., Liam, P. S., & Ooi, M. P.-L. (2012). Multisine With Optimal Phase-Plane Uniformity for ADC Testing. IEEE Transactions on Instrumentation & Measurement, 61(3), 566–578. https://doi.org/10.1109/TIM.2011.2169614
Chicago
Ong, Meng Sang, Ye Chow Kuang, Poon Shern Liam, and Melanie Po-Leen Ooi. 2012. “Multisine With Optimal Phase-Plane Uniformity for ADC Testing.” IEEE Transactions on Instrumentation & Measurement 61 (3): 566–78. doi:10.1109/TIM.2011.2169614.