Thickness-dependent converse magnetoelectric coupling in bi-layered Ni/PZT thin films.

The converse magnetoelectric (ME) effect was investigated in bi-layered Ni/Pb(Zr0.52Ti0.48)O3 (PZT) thin films grown on Si substrates, with different thicknesses of Ni thin layers. By using an AC-mode magneto-optical Kerr effect method, it was revealed that the electric-voltage induced magnetization variation was dependent on the thickness of the Ni thin layer. The results showed that the Ni/PZT bilayered films with thick (about 40 nm) Ni films presented a dominative strain mediated ME coupling, whereas an interface-charge and strain co-mediated ME coupling might coexist in the Ni/PZT bilayered films with decreasing thickness (e.g., about 10 nm) of Ni films. [ABSTRACT FROM AUTHOR]