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Fundamental parameter based quantification algorithm for confocal nano-X-ray fluorescence analysis

Authors :
Schoonjans, Tom
Silversmit, Geert
Vekemans, Bart
Schmitz, Sylvia
Burghammer, Manfred
Riekel, Christian
Brenker, Frank E.
Vincze, Laszlo
Source :
Spectrochimica Acta Part B. Jan2012, Vol. 67, p32-42. 11p.
Publication Year :
2012

Abstract

Abstract: A new method for the quantification of X-ray fluorescence (XRF) was derived based on the fundamental parameter method (FPM). The FPM equations were adapted to accommodate the special case of confocal nano-XRF, i.e. X-ray nano-beam excitation coupled with confocal detection, taking into account the special characteristics of the detector channel polycapillary. A thorough error estimation algorithm based on the Monte Carlo method was applied, producing a detailed analysis of the uncertainties of the quantification results. The new FPM algorithm was applied on confocal nano-XRF data obtained from cometary dust returned by NASA''s Stardust mission, recorded at beamline ID13 of the European Synchrotron Radiation Facility. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
05848547
Volume :
67
Database :
Academic Search Index
Journal :
Spectrochimica Acta Part B
Publication Type :
Academic Journal
Accession number :
72591173
Full Text :
https://doi.org/10.1016/j.sab.2011.12.006