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Intrinsic photoconductivity in chromium disilicide epitaxial thin films.
- Source :
-
Semiconductors . Aug97, Vol. 31 Issue 8, p826. 3p. - Publication Year :
- 1997
-
Abstract
- Spectral and integrated photoconductivities in chromium-disilicide epitaxial films grown on singlelayer silicon substrates have been studied in the photon energy range 0.5 - 1.6 eV. The region of the photoconductivity maximum observed at 1.23 eV corresponds to the third direct interband transition in chromium disilicide at 0.9 - 0.95 eV. Possible reasons for the weak photoconductivity signal in the region of the fundamental absorption edge are analyzed. [ABSTRACT FROM AUTHOR]
- Subjects :
- *PHOTOCONDUCTIVITY
*SILICON crystals
Subjects
Details
- Language :
- English
- ISSN :
- 10637826
- Volume :
- 31
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Semiconductors
- Publication Type :
- Academic Journal
- Accession number :
- 7317785
- Full Text :
- https://doi.org/10.1134/1.1187262