Cite
Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction.
MLA
Zhang, K. H. L., et al. “Determination of the Poisson Ratio of (001) and (111) Oriented Thin Films of In2O3 by Synchrotron-Based x-Ray Diffraction.” Physical Review B: Condensed Matter & Materials Physics, vol. 84, no. 23, Dec. 2011, pp. 233301-1-233301–04. EBSCOhost, https://doi.org/10.1103/PhysRevB.84.233301.
APA
Zhang, K. H. L., Regoutz, A., Palgrave, R. G., Payne, D. J., Egdell, R. G., Walsh, A., Collins, S. P., Wermeille, D., & Cowley, R. A. (2011). Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction. Physical Review B: Condensed Matter & Materials Physics, 84(23), 233301-1-233301–233304. https://doi.org/10.1103/PhysRevB.84.233301
Chicago
Zhang, K. H. L., A. Regoutz, R. G. Palgrave, D. J. Payne, R. G Egdell, A. Walsh, S. P. Collins, D. Wermeille, and R. A. Cowley. 2011. “Determination of the Poisson Ratio of (001) and (111) Oriented Thin Films of In2O3 by Synchrotron-Based x-Ray Diffraction.” Physical Review B: Condensed Matter & Materials Physics 84 (23): 233301-1-233301–4. doi:10.1103/PhysRevB.84.233301.