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Spectroscopic determination of crystal-field levels in CeRh2Si2 and CeRu2Si2 and of the 4f0 contributions in CeM2Si2 (M=Cu, Ru, Rh, Pd, and Au).

Authors :
Willers, T.
Adroja, D. T.
Rainford, B. D.
Hu, Z.
Hollmann, N.
Körner, P. O.
Chin, Y.-Y.
Schmitz, D.
Hsieh, H. H.
Lin, H.-J.
Chen, C. T.
Bauer, E. D.
Sarrao, J. L.
McClellan, K. J.
Byler, D.
Geibel, C.
Steglich, F.
Aoki, H.
Lejay, P.
Tanaka, A.
Source :
Physical Review B: Condensed Matter & Materials Physics. Jan2012, Vol. 85 Issue 4, p1-8. 8p.
Publication Year :
2012

Abstract

We have determined the ground-state wave functions and crystal-field-level schemes of CeRh2Si2 and CeRu2Si2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering, We find large crystal-field splittings and ground-state wave functions which are made of mainly Jz = | ±5/2) with some amount of |∓3/2) in both the compounds. The 4f° contribution to the ground state of several members of the CeM2Si2 family with M = (Cu, Ru. Rh. Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the derealization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu2Si2 by Yano et al. [Phys. Rev. B 77. 0351IX (2008)]. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10980121
Volume :
85
Issue :
4
Database :
Academic Search Index
Journal :
Physical Review B: Condensed Matter & Materials Physics
Publication Type :
Academic Journal
Accession number :
73491609
Full Text :
https://doi.org/10.1103/PhysRevB.X5.0351 17