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LOCATING SEVERAL SMALL INCLUSIONS IN IMPEDANCE TOMOGRAPHY FROM BACKSCATTER DATA.

Authors :
Hanke, Martin
Source :
SIAM Journal on Numerical Analysis. 2011, Vol. 49 Issue 5/6, p1991-2016. 26p.
Publication Year :
2011

Abstract

This paper investigates backscatter data for the inverse obstacle problem in impedance tomography, when the obstacles are small. It is shown that under this circumstance the backscatter data are close approximations of a rational function that has second or fourth order poles at the locations of the obstacles. Furthermore, a numerical method is presented to locate the obstacles via the poles of certain Laurent-Padé approximations. Numerical experiments explore the potential of this algorithm also for extended obstacles, taking into consideration that the problem is severely ill-posed. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00361429
Volume :
49
Issue :
5/6
Database :
Academic Search Index
Journal :
SIAM Journal on Numerical Analysis
Publication Type :
Academic Journal
Accession number :
73881185
Full Text :
https://doi.org/10.1137/100810290