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Arbitrary waveform power controller for thermal measurements of semiconductor devices.

Authors :
Davidson, J.N.
Stone, D.A.
Foster, M.P.
Source :
Electronics Letters (Institution of Engineering & Technology). 3/29/2012, Vol. 48 Issue 7, p400-402. 3p. 2 Diagrams, 1 Graph.
Publication Year :
2012

Abstract

Presented is a simple and easy-to-implement design for an arbitrary waveform power controller. The power dissipation in an active semiconductor device is controlled by virtue of its current and voltage for any waveform. By measuring the heating effect on an electronic product, an engineer can evaluate the effectiveness of its design. The controller is demonstrated practically with a MOSFET using an arbitrary waveform, and power dissipated in the device agrees well with intended dissipation. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00135194
Volume :
48
Issue :
7
Database :
Academic Search Index
Journal :
Electronics Letters (Institution of Engineering & Technology)
Publication Type :
Academic Journal
Accession number :
73928868
Full Text :
https://doi.org/10.1049/el.2011.3927