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Visualization of defect densities in reduced graphene oxide

Authors :
Eigler, Siegfried
Dotzer, Christoph
Hirsch, Andreas
Source :
Carbon. Aug2012, Vol. 50 Issue 10, p3666-3673. 8p.
Publication Year :
2012

Abstract

Abstract: Efficiently reducible graphene oxide (GO) was obtained, even if a high degree of functionalization is present. Graphite with few defects was used as starting material and oxidized according to Hummer’s method. An extremely high I D/I G ratio for rGO of 2.8 (532nm) was observed in the Raman spectrum as a consequence of the lower defect density in GO. It was also possible to demonstrate the impact of local defects on the structure in rGO by local laser exposure experiments on single graphene oxide flakes. Raman spectroscopy can visualize the laser impact by I D/I G ratio measurements. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00086223
Volume :
50
Issue :
10
Database :
Academic Search Index
Journal :
Carbon
Publication Type :
Academic Journal
Accession number :
76177181
Full Text :
https://doi.org/10.1016/j.carbon.2012.03.039