Noncontact minority-carrier lifetime measurement for magnetic field applied Czochralski silicon crystals.

MLA

Kirino, Y., and F. Shimura. “Noncontact Minority-Carrier Lifetime Measurement for Magnetic Field Applied Czochralski Silicon Crystals.” Journal of Applied Physics, vol. 69, no. 4, Feb. 1991, p. 2700. EBSCOhost, https://doi.org/10.1063/1.348641.

APA

Kirino, Y., & Shimura, F. (1991). Noncontact minority-carrier lifetime measurement for magnetic field applied Czochralski silicon crystals. Journal of Applied Physics, 69(4), 2700. https://doi.org/10.1063/1.348641

Chicago

Kirino, Y., and F. Shimura. 1991. “Noncontact Minority-Carrier Lifetime Measurement for Magnetic Field Applied Czochralski Silicon Crystals.” Journal of Applied Physics 69 (4): 2700. doi:10.1063/1.348641.