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Room-temperature hydrogenation effect on Si- and Be-ion-implanted GaAs.

Authors :
Cho, Hoon Young
Kim, Eun Kyu
Lee, Ho Sub
Min, Suk-Ki
Source :
Journal of Applied Physics. 2/15/1992, Vol. 71 Issue 4, p1690. 3p. 4 Graphs.
Publication Year :
1992

Abstract

Discusses a study which investigated hydrogenation effects on silicon- and beryllium-ion-implanted GaAs exposed to the hydrogen plasma. Change in electron mobilities that occurred in the sample hydrogenated for 60 minutes at room temperature; Factor responsible for defect and impurity passivation in crystalline semiconductor materials; Reasons for not utilizing atomic hydrogen processing.

Details

Language :
English
ISSN :
00218979
Volume :
71
Issue :
4
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
7629620
Full Text :
https://doi.org/10.1063/1.351198