Classical electron trajectory in scanning electron microscope mirror image method.

Authors :: Chen, H.
Gong, H.
Ong, C. K.
Source :: Journal of Applied Physics. 7/15/1994, Vol. 76 Issue 2, p806. 4p. 1 Chart, 3 Graphs.
Publication Year :: 1994
Abstract: Presents a study which examined the charging phenomenon of polymethylmethacrylate using a scanning electron microscope for the mirror image method employed. Materials and methods used; Equation expressing the scattering method; Application and discussion.

Subjects :: *POLYMETHYLMETHACRYLATE
*SCANNING electron microscopes
*SCATTERING operator

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