Cite
Analysis of ordering in GaInP by means of x-ray diffraction.
MLA
Liu, Q., et al. “Analysis of Ordering in GaInP by Means of X-Ray Diffraction.” Journal of Applied Physics, vol. 73, no. 6, Mar. 1993, p. 2770. EBSCOhost, https://doi.org/10.1063/1.353052.
APA
Liu, Q., Lakner, H., Scheffer, F., Lindner, A., & Prost, W. (1993). Analysis of ordering in GaInP by means of x-ray diffraction. Journal of Applied Physics, 73(6), 2770. https://doi.org/10.1063/1.353052
Chicago
Liu, Q., H. Lakner, F. Scheffer, A. Lindner, and W. Prost. 1993. “Analysis of Ordering in GaInP by Means of X-Ray Diffraction.” Journal of Applied Physics 73 (6): 2770. doi:10.1063/1.353052.